FeaturesNotes:
•VDD = VDDQ = 1.2V ±60mV
•VPP=2.5V,-125mV,+250mV•On-die, internal, adjustable VREFDQ generations
•1.2V pseudo open-drain I/Os
•TC maximum up to 95℃
- 64ms, 8192-cycle refresh up to 85℃
-32ms, 8192-cycle refresh at >85℃ to 95℃
•16 internal banks (x4, x8): 4 groups of 4 banks eachs
• 8 internal banks (x16): 2 groups of 4 banks eachs
• 8n-bit prefetch architectures
• Programmable data strobe preambless
• Data strobe preamble trainings
• Command/Address latency (CAL)s
• Multipurpose register READ and WRITE capabilitys
• Write levelings
• Self refresh modes
• Low-power auto self refresh (LPASR)s
•Temperature controlled refresh (TCR)s
• Fine granularity refreshs
• Self refresh aborts
• Maximum power savings
• Output driver calibrations
• Nominal, park, and dynamic on-die termination(ODT)s
• Data bus inversion (DBI) for data buss
• Command/Address (CA) paritys
• Databus write cyclic redundancy check (CRC)s
• Per-DRAM addressability
• Connectivity tests
• JEDEC JESD-79-4 compliants
• sPPR and hPPR capabilitys
• MBIST-PPR support (Die Revision F
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